Technological Innovation

What is IEC 60068-2-100:2014?

IEC 60068-2-100:2014 is an international standard that specifies the various methods for testing equipment and components under conditions of different climatic and mechanical stresses. This standard is titled "Environmental testing - Part 2-100: Tests - Test Xb and guidance: Mould growth". It provides guidelines to evaluate the resistance of products against mold growth and assess their durability in the presence of mold.

Testing Methods for Mold Growth Resistance

This section of IEC 60068-2-100:2014 outlines the specific procedures and parameters for conducting the tests to determine mold growth resistance. The standard defines the temperature, humidity, and other environmental factors required to simulate different climatic conditions. It also explains the use of fungal spores or fungal mycelium to initiate and promote mold growth on the test specimens.

Significance in Product Development

The inclusion of IEC 60068-2-100:2014 in the product development process is crucial to ensure that the final product can withstand the challenges related to mold growth. Mold can lead to material degradation, compromised performance, and potential health risks. Testing according to this standard helps manufacturers identify weaknesses in their designs, select appropriate materials, and make necessary modifications to improve mold resistance.

Application in Various Industries

IEC 60068-2-100:2014 has wide-ranging applications across industries such as electronics, automotive, aerospace, and construction. Electrical enclosures, printed circuit boards, seals, gaskets, and other vulnerable components can be evaluated for their ability to resist mold growth. Compliance with this standard ensures that the products meet the necessary quality and safety requirements.

CONTACT US

Contact: Cindy

Phone: +86-13751010017

E-mail: sales@iecgauges.com

Add: 1F Junfeng Building, Gongle, Xixiang, Baoan District, Shenzhen, Guangdong, China

Scan the qr codeclose
the qr code
TAGS Test Probe BTest Probe 18Test Probe 11Go GaugesIEC 61032IEC 60335Test PinTest FingerIEC 60061-3Wedge Probe7006-29L-47006-27D-37006-11-87006-51-27006-51A-2 7006-50-17006-27C-17006-28A-1Test Probe7006-27B-1IEC 61010IEC 60529IEC 60068-2-75