Wedge Probe of UL 60950-1

Item No.: LX-S113
Include CNAS & ILAC Calibration Certificate
E-mail: sales@iecgauges.com
Made in China
Please contact us for more detailed pdf files.


1. Reference standard:

UL60950 Figure NAF2 and NAF3

UL 60950 wedge probe for paper shredders


2. Product Details:

This product is used for testing access to document shredders. The Jointed Accessibility Wedge Probe is a high  precision probe made in exact accordance with UL and IEC standards such as UL60950 Figure NAF2 and NAF3.



Company introduction

HK LEE HING INDUSTRY CO., LIMITED are specialized in manufacturing special, custom built, test and measuring equipment for products testing as per international norms and offering calibration services and related information. Our products and services are used by research & development establishments, test laboratories, defense establishments, government institutions & manufacturing industries to fulfill the clients' requirements.


Main Products: Go No go gauges, IP Tester, test probe Kit, Impact Test Equipment, Test Probes, Spring Hammer, IEC 61032 test finger, AC Hipot Tester, IEC Test Probe, UL Test Probe, Material Flammability Tester, IP Code Tester, Impact Test Apparatus, Plugs and Socket Outlet Gauge, Security Testing Machine, Lamp Cap Gauge Tester, Lampholders Gauge Tester, Plug & Socket Tester, Electrical Safety Tester, LED Test Instruments, Environmental Test Equipment, Instrument Accessories, Weighing Sensor and More.


If you require equipment to test products such as home appliances, electrical accessories like switches, sockets, connectors, etc. industrial & road lighting luminaires, automobile lighting systems or related categories, we can provide the solutions you need.


We would appreciate your comments on the layout design, presentation or other aspects of our website.

Website: http://www.iecgauges.com



Contact information

Contacts: Cindy

E-mail: sales@iecgauges.com

TEL: +86-755-33168386

FAX: +86-755-61605199

Phone: +86-15919975191

SKYPE: nina.she@outlook.com

Address: 1F Junfeng Building, Gongle, Xixiang, Baoan District, Shenzhen, Guangdong, China

ZIP: 518102

Website: http://www.iecgauges.com/


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TAGS Test Probe BTest Probe 18Test Probe 11Go GaugesIEC 61032IEC 60335Test PinTest FingerIEC 60061-3Wedge Probe7006-29L-47006-27D-37006-11-87006-51-27006-51A-2 7006-50-17006-27C-17006-28A-1Test Probe7006-27B-1IEC 61010IEC 60529IEC 60068-2-75